Micron Series Semiconductor Probes are used in test sockets for component and test interfaces. Their rugged construction, high life and fine pitch capability have proved themselves invaluable. The construction of this fine pitch probe allows it to be designed into product applications that demand very low resistance and inductance.
While conventional spring probes use a design that rely on friction between the barrel and plunger to make contact, in dirty environments this allows for contamination to work its way between the barrel and plunger, thereby interfering with conductivity. The internal resistance of Micron Series probe will be virtually unaffected by contamination present in the test environment due to its unique construction; the Micron probe uses a spring-over-plunger crimp design that has proven itself to be impervious to contamination.
Another are in which the Micron Series probe excels is high frequency test. Micron Series Semiconductor Probes have been tested to 19GHZ, far above standard design probes. In the arena of high speed device interfaces, Micron probes are invaluable.
Although Micron probes are shown for use with test centers of .015”, .020”, .025” and .030” it is possible for them to be mounted on a much closer pitch configuration. The drilling pattern will need to be adjusted this consequently reduces the wall thickness between probes. Please review the 'Micron Application Guide' and 'Micron Care and Cleaning Guide' for further information.
The unique and proprietary design incorporated in the Micron Probe Series is covered by US and international patents.
For further information please review the product specifications in our on-line catalog pages. Please take a little time to review our products or if you like call for assistance at any time day or night seven days a week. 1-800-540-4210 International +1-775-833-4395
Email: engineering@connect2it.com |
