The Semiconductor industry demands on the probe industry for very small test centers, high speed and long life has opened many opportunities for Connet2it. We can supply the very best in US Manufactured semiconductor test probes. Their rugged construction, high life and fine pitch capability have proved themselves invaluable. The construction of this fine pitch probe allows it to be designed into product applications that demand very low resistance and inductance.
While conventional spring probes use a design that rely on friction between the barrel and plunger to make contact, in dirty environments this allows for contamination to work its way between the barrel and plunger, thereby interfering with conductivity. The internal resistance of Micron Series probe will be virtually unaffected by contamination present in the test environment due to its unique construction; the Micron probe uses a spring-over-plunger crimp design that has proven itself to be impervious to contamination.
Connect2it also offers fine pitch Conductive Elastomers for either test or in product applications.
For more information please review our Semiconductor Probe and Conductive Elastomer selection
Semiconductor Probes : http://www.connect2it.com/semiconductor_test_probes.html
Conductive Elastomer: http://www.connect2it.com/product_data.html
Please take a little time to review our products or if you like call for assistance at any time day or night seven days a week. 1-800-540-4210 International +1-775-833-4395
Email: engineering@connect2it.com
 Spring Contact Probes 31 (0.8 mm) Mil centre pitch and greater
Spring Contact Probes 50 (1.27 mm) Mil centre pitch and greater
Spring Contact Probes 75 (1.90 mm) Mil centre pitch and greater
Spring Contact Probes 100 (2.54 mm) Mil centre pitch and greater
Spring Contact Probes 126 (3.2 mm) Mil centre pitch and greater
High Current Spring Contact Probes
Threaded Screw-Fit Probes
Switch-Probes
Pneumatic Contact Probes
Interface Pins/ Battery Contact Probes
Semiconductor Probes
Automotive Probes
Elastome
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